software solutions

c-Alice

The All-Images-Classification-Engine for production control

Convanit provides a complete solution for AI based image classification to enable companies to automatically analyze images of any type.

Optical microscope and SEM images, CD-SEM, defect wafer maps, electrical test data and other use cases

centralized

One centralized AI-framework for the whole production site

independent

Independent of imaging systems

customizable

optimized algorithms based on use case

Your benefits

one for all

c-Alice can classify all types of images: any type of inspection / microscopy, wafer maps, test maps and others.

fast & accurate

c-Alice generates classification results in seconds. High accuracy is achieved by using fast and optimized algorithms.

complete workflow

c-Alice provides image and recipe management including versioning, monitoring, deployment and meta data integration. Low maintenance effort and reduced manpower ensure efficient classification in production.

easy set-up

c-Alice allows easy recipe set up without further AI knowledge. Users can manage images and context data comfortably in order to train, verify and release recipes.

flexible

c-Alice is based on a modern architecture and can be integrated flexibly in your production environment.

Use Cases

Supervised

classification of failure types in defect images, pattern recognition of defect and binsort wafer map

Semi-Supervised

image sets presorting

Unsupervised

anomaly detection and more

From classification towards characterization

 Beyond just image classification, c-alice can process arbitrary data along with the images to characterize defects and other problems.

Implementation scenario in a semiconductor production environment

Who we are

Convanit combines domain experts, data scientists and software developers to create concepts, methods and tools in the area of yield improvement and production monitoring. We love this versatility and the resulting creativity.

10+ experts are working on the c-Alice project

convanit GmbH & Co. KG

combination with IT and data science

Founded in

2010

in Germany

Experts with more than

30

years of industry expertise in production control

Projects in more than

20

manufacturing sites

Our Networks

Cooperation with several local AI expert groups within university and institutes

Silicon Saxony

member and active lead of working group ‚Yield and Reliability‘

VDI/GMM

lead of conferences: ‚European Yield Enhancement group‘ & ‚DIA (data integration and analytics) group‘

SEF

member of smart electronic factory

Smart System Hub

member of Smart System Hub

Selection of our clients

Latest publications

Digitale Welt: KI in der Fertigungskontrolle – Herausforderungen und Strategien

Für die Bewertung von Zeitreihen-, Bild- und anderen Daten, ist gerade bei Zuordnungs- und Klassifizierungsaufgaben und der Erkennung von Mustern und Anomalien der Nutzen von KI Methoden hoch. Die dafür notwendige Rechenleistung ist heute ‚bezahlbar‘ und erprobte Mathematik sowie mächtige Open-Source Softwarebibliotheken stehen zur Verfügung. Dieser Artikel beschreibt Herausforderungen bei der Einführung von KI Methoden in der Fertigungskontrolle und die daraus abzuleitenden Strategien.

Silicon Saxony - Smart Systems: Vom individuellen KI Anwendungsfall zur zeitnahen bezahlbaren Umsetzung in der Fertigung

Im KMU Bereich gibt es noch viele ‚ungehobene Schätze‘ im Bereich KI, wie zum Beispiel in der Fertigungskontrolle. Fachwissen, KI Methoden und Daten sind zwar vorhanden, jedoch fehlt für eine produktionsreife Lösung häufig noch das richtige Konzept zur pragmatischen Verbindung dieser Komponenten. Der Weg dahin muss nicht schwer sein, wenn man sich auf das Wesentliche konzentriert.

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